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（1 寧波大學(xué)建筑工程與環(huán)境學(xué)院， 寧波 315211； 2 中國建筑科學(xué)研究院有限公司， 北京 100013）

［摘要］采用壓電阻抗技術(shù)對(duì)裝配式混凝土結(jié)構(gòu)鋼筋連接套筒灌漿密實(shí)度的識(shí)別進(jìn)行了試驗(yàn)研究。試驗(yàn)設(shè)計(jì)制作了單獨(dú)套筒、套筒+素混凝土兩組試件，并在單獨(dú)套筒試件的套筒表面和套筒+素混凝土試件的混凝土表面布置壓電片，采集壓電片在不同灌漿工況下的電導(dǎo)信號(hào)。根據(jù)該信號(hào)頻譜曲線的諧振頻率和峰值變化對(duì)套筒灌漿密實(shí)度做出識(shí)別判斷，并以套筒灌漿密實(shí)時(shí)信號(hào)為標(biāo)準(zhǔn)信號(hào)，采用均方根偏差作為識(shí)別套筒灌漿密實(shí)度的量化指標(biāo)。試驗(yàn)結(jié)果表明，以套筒灌漿密實(shí)時(shí)電導(dǎo)曲線為基準(zhǔn)，波峰處諧振頻率向頻率增大的方向偏移、電導(dǎo)峰值上升、電導(dǎo)均方根偏差增大能作為識(shí)別套筒灌漿不密實(shí)的有效指標(biāo)。

［關(guān)鍵詞］壓電阻抗技術(shù)； 灌漿套筒連接； 灌漿密實(shí)度； 均方根偏差

中圖分類號(hào)：TM282, TP206+.1，TU375 文獻(xiàn)標(biāo)識(shí)碼：A文章編號(hào)：1002-848X(2018)23-0011-06

Experimental study on identification of sleeve grouting compactness based on piezoelectric impedance effect

Chen Wenlong1, Li Junhua1, Yan Wei1, Sun Bin2

(1 College of Civil Engineering and Environment, Ningbo University, Ningbo 315211, China； 2 China Academy of Building Research, Beijing 100013, China)

Abstract:Experiments on grouting compactness identification of rebar connecting sleeves for prefabricated concrete structures were carried out by using piezoelectric impedance technology. Two groups of individual  sleeve specimens were designed and made, including individual sleeve group and sleeve + plain concrete group. The piezoelectric patches were arranged on the surface of individual sleeve specimens and the concrete suface of sleeve+plain concrete specimens to collect conductance signals of piezoelectric patches under different grouting conditions. According to the resonance frequency and peak value of the signal spectrum curve, the sleeve grouting compactness was identified and judged, and the sleeve grouting dense real-time signal was used as the standard signal, and the root mean square deviation was used as the quantitative index for identifying the sleeve grouting compactness. The experimental results show that，taking the conductance curve of sleeve grouting dense as the reference，the offset of resonant frequency of the peak in the direction of increasing frequency, the rise of conductance peak value and the increase of conductance root mean square deviation can be used as an effective indicator to identify the incomplete filling of the sleeve.

Keywords:piezoelectric impedance technology; grouting coupler connection; grouting compactness; root mean square deviation

 * 國家重點(diǎn)研發(fā)計(jì)劃項(xiàng)目（2016YFCO701800）。

通訊作者：李俊華，博士，教授，博士生導(dǎo)師，Email: lijunhua@nbu.edu.cn。